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Ships within 48 hours · Estimated delivery Aug 5 - Aug 10
150mm / 6"
50µm and 500µm
Construction
Maximum specimen height between mount surface and closed lid is 16mm (5/8")
ElectriMulti75-G Select Quantity:10 per set 150mm / 6"Electrical, Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical, Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM), and electric modes such as: scanning capacitance microscopy (SCM) electrostatic force microscopy (EFM) Kelvin probe force microscopy (KFM) scanning probe lithography The rotated tip allows for more symmetric representation of high sample
